A 20 nm thick ferroelectric copolymer film was poled using an atomic force microscope tip. The piezoelectric response shown in this image was measured by recording the motion of a piezoresistive cantilever when a potential was applied across the film.
This Torii (gate) of a JinJa (Shinto shrine) is about 2 microns wide. No differences in topographic measurements of the polymer are found before and after poling with a conducting atomic force microscope probe tip.
We are developing tools to go to even smaller scales. We are coupling these efforts to the development of both inorganic and organic materials with nanometer-scale textures so that the synergy of the materials properties, control capabilities, and probe capabilities bring us to yet smaller scales.
